The AIM Lab at NanoCenter will be offering a short course in Scanning Electron Microscopy (SEM) during this summer break (June 2018) using our Hitachi SU-70 High Resolution Analytical SEM and Tescan FIB/SEM.
The short course provides an introduction to the SEM for those with little or no prior experience. This course covers basic principles and knowledge of the scanning electron microscope including energy-dispersive x-ray spectroscopy (EDS). In addition to lectures, there will be an emphasis on laboratory exercises that focus on instrument operation and practical applications.
Date: June 12, 13, 14 and 15, 2018
Lecture: 9:30 to 11:40 am.
Laboratory: Two hours/group/day (4 days, June 12, 13, 14 and 15, 2018)
Rooms: Lecture: TBA
Lab: SEM facility, Kim Building room 1237C
Limit: Maximum enrollment is 9 (3 lab groups, 3 persons per group)
Fee: $385 per person, $350 per person from the same research group and/or participate FIB/TEM short course. $200 per person for taking lectures or lab (permission is required from the instructor) only. Fees for non-UMD participants will be different. Please check with the AIM Lab office.
To enroll, please print and fill out the application form, and submit to the AIM Lab office by 5:00 pm, June 7, 2018 (Thursday) at room 1234 or 1237A Kim Building. Students accepted into the class will be informed by e-mail by Sunday (06/10/18).
To encourage all potential users to register for the short course, a discount will be offered to individuals if they are affiliated with a research group where other members are also enrolled in the course or if s/he is attending both TEM and SEM short courses (see TEM short course announcement).
* This fee applies to UMD users only. Different fees apply for non-UMD participants; please check with the AIM Lab office.
For more information regarding the SEM short course, please contact Wen-An Chiou at AIM Lab, or at (301)-405-0541 or send an e-mail to firstname.lastname@example.org